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Bruker AXS Wins Prestigious R&D 100 Award For Novel XFlash QUAD Detector for X-ray Microanalysis on Electron Microscopes

28 Jul 2006 - Bruker AXS Inc. announced that R&D Magazine has selected its novel XFlash(R) QUAD detector for a 2006 R&D 100 Award. The R&D 100 awards recognize the most technologically significant products introduced into the marketplace during the past year.
 
The XFlash QUAD detector is a key component of Bruker AXS' recently announced QUANTAX(TM) QUAD ultra-fast and sensitive Energy-Dispersive Spectroscopy (EDS) system for X-ray microanalysis on electron microscopes. The XFlash QUAD detector is the first four channel 40 mm(2) Silicon Drift Detector (SDD) for EDS. Powered by ESPRIT(TM) software, the QUANTAX QUAD delivers significantly faster EDS results across a broad range of applications. It is especially suitable for field emission scanning electron microscopes, environmental and low vacuum scanning electron microscopes.
 
Roger Durst, Ph.D., Executive Vice President and Chief Technology Officer at Bruker AXS, commented: "Bruker AXS has pioneered the development of Silicon Drift Detectors technology. With their unique combination of high counting rate capability and superb energy resolution, these detectors are now widely acknowledged as the new gold standard for EDS."